Open AccessElectro-Optic Characteristics of the Fringe Field Switching (FFS) Mode Depending on Thickness of Passivation Layer between Pixel and Common Electrodes
Author(s) -
Junho Jung,
Kyung-Su Ha,
Young-Jin Lim,
IlSou Yoo,
Yeon-Hak Jeong,
JaeJin Lyu,
KyeongHyeon Kim,
SeungHee Lee
Publication year - 2009
Publication title -
journal of the korean institute of electrical and electronic material engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2009.22.7.589
Subject(s) - passivation , materials science , electrode , layer (electronics) , transmittance , optoelectronics , optics , dielectric , saturation (graph theory) , composite material , chemistry , physics , mathematics , combinatorics
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