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Analytical Model of TFT Drain Current based on Effective Area and Average Velocity
Author(s) -
Taehee Jung,
Chang-Sub Won,
Se-Hwan Ryu,
Deuk-Young Han,
HyungKeun Ahn
Publication year - 2008
Publication title -
journal of the korean institute of electrical and electronic material engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2008.21.3.197
Subject(s) - thin film transistor , square (algebra) , materials science , current (fluid) , grain size , channel (broadcasting) , electric field , crystallite , mechanics , electrical engineering , composite material , engineering , mathematics , geometry , metallurgy , physics , layer (electronics) , quantum mechanics

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