Open AccessRaman Scattering Characteristics on 3C-SiC Thin Films Deposited by APCVD Method
Publication year - 2007
Publication title -
jeon'gi jeonja jaeryo haghoe nonmunji/jeon-gi jeonja jaeryo hakoe nonmunji
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2007.20.7.606
Subject(s) - materials science , full width at half maximum , raman spectroscopy , phonon , crystallite , crystallinity , raman scattering , substrate (aquarium) , thin film , crystal (programming language) , condensed matter physics , analytical chemistry (journal) , optics , optoelectronics , nanotechnology , composite material , physics , chemistry , oceanography , chromatography , geology , metallurgy , programming language , computer science