Open AccessDefect Analysis via Photoluminescence of p-type ZnO:N Thin Film fabricated by RF Magnetron Sputtering
Author(s) -
Hu-Jie Jin,
Soon-Jin So,
Choon-Bae Park
Publication year - 2007
Publication title -
journal of the korean institute of electrical and electronic material engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2007.20.3.202
Subject(s) - photoluminescence , materials science , van der pauw method , sputter deposition , optoelectronics , acceptor , annealing (glass) , thin film , band gap , light emitting diode , sputtering , conductivity , cavity magnetron , doping , exciton , analytical chemistry (journal) , electrical resistivity and conductivity , hall effect , nanotechnology , chemistry , composite material , condensed matter physics , electrical engineering , physics , engineering , chromatography
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