Open AccessFabrication and Characteristic Analysis of Single Poly-Si flash EEPROM
Author(s) -
Kwon Young-Jun Jung Jung-Min Park Keun-Hyung
Publication year - 2006
Publication title -
journal of the korean institute of electrical and electronic material engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2006.19.7.601
Subject(s) - eeprom , capacitive coupling , eprom , flash (photography) , electrical engineering , capacitive sensing , fabrication , materials science , optoelectronics , coupling (piping) , voltage , threshold voltage , transistor , engineering , physics , optics , composite material , medicine , alternative medicine , pathology
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