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Electrical Characteristics of LOMOST under Various Overlap Lengths between Gate and Drift Region
Author(s) -
하종봉,
Kyoung-Rok Cho,
Yeong Seuk Kim,
Kee Yeol Na
Publication year - 2005
Publication title -
journal of the korean institute of electrical and electronic material engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2005.18.7.667
Subject(s) - materials science , omega , voltage , breakdown voltage , optoelectronics , electrical engineering , cmos , physics , engineering , quantum mechanics

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