z-logo
open-access-imgOpen Access
Work Function Changes on MgO Protective Layer after O2plasma Treatment from Ion-induced Secondary Electron Emission Coefficient
Author(s) -
Jae-Cheon Jeong,
SeGi Yu,
Jaewon Cho
Publication year - 2005
Publication title -
journal of the korean institute of electrical and electronic material engineers
Language(s) - English
Resource type - Journals
eISSN - 2288-3258
pISSN - 1226-7945
DOI - 10.4313/jkem.2005.18.3.259
Subject(s) - materials science , work function , ion , plasma , layer (electronics) , electron , secondary emission , composite material , function (biology) , work (physics) , analytical chemistry (journal) , atomic physics , chemistry , physics , thermodynamics , environmental chemistry , organic chemistry , quantum mechanics , evolutionary biology , biology

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom