Open AccessThickness control of thin dielectric layers by the generalized m-line spectroscopy method
Author(s) -
Elżbieta Auguściuk,
Bartłomiej Bogdanowicz
Publication year - 2010
Publication title -
photonics letters of poland
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.184
H-Index - 16
ISSN - 2080-2242
DOI - 10.4302/plp.2010.2.06
Subject(s) - optics , waveguide , planar , refractive index , materials science , prism , coupling (piping) , thin film , dielectric , multi mode optical fiber , physics , optoelectronics , optical fiber , computer science , nanotechnology , computer graphics (images) , metallurgy