In situ Stress Measurements with Submonolayer Sensitivity As a Probe of Coherent-to-incoherent Matching at an Interface in Ultrathin Magnetic Films | Zendy

JongRyul Jeong | Zendy; Young-Seok Kim | Zendy; SungChul Shin | Zendy

Open Access

In situ Stress Measurements with Submonolayer Sensitivity As a Probe of Coherent-to-incoherent Matching at an Interface in Ultrathin Magnetic Films

Author(s) -

JongRyul Jeong,

Young-Seok Kim,

SungChul Shin

Publication year - 2002

Publication title -

journal of magnetics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 15

eISSN - 2233-6656

pISSN - 1226-1750

DOI - 10.4283/jmag.2002.7.4.151

Subject(s) - materials science , detector , cantilever , stress (linguistics) , substrate (aquarium) , sputter deposition , sensitivity (control systems) , optoelectronics , in situ , displacement (psychology) , bending , optics , relaxation (psychology) , thin film , sputtering , nanotechnology , composite material , chemistry , physics , psychology , social psychology , linguistics , philosophy , oceanography , engineering , organic chemistry , electronic engineering , psychotherapist , geology

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