Open AccessThickness-dependent Film Resistance of Thin Porous Film
Author(s) -
Aree Song,
Chul-Sung Kim,
Taejoon Kouh
Publication year - 2012
Publication title -
journal of the korean magnetics society
Language(s) - English
Resource type - Journals
eISSN - 2233-6648
pISSN - 1598-5385
DOI - 10.4283/jkms.2012.22.1.006
Subject(s) - materials science , anodizing , percolation (cognitive psychology) , percolation theory , thin film , composite material , substrate (aquarium) , porosity , scattering , electrical resistivity and conductivity , sheet resistance , conductivity , optics , layer (electronics) , nanotechnology , aluminium , chemistry , oceanography , physics , electrical engineering , engineering , neuroscience , geology , biology
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom