Open AccessAnnealing Effect on Magneto-transport Properties of Amorphous Ge1-xMnxSemiconductor Thin Films
Author(s) -
DongHwi Kim,
Byeong-Cheol Lee,
Trần Thị Lan Anh,
Young Eon Ihm,
Dojin Kim,
Hyojin Kim,
Sang-Soo Yu,
Kui-Jong Baek,
Chang-Soo Kim
Publication year - 2009
Publication title -
han-guk jagi hakoeji/han'gug ja'gi haghoeji
Language(s) - English
Resource type - Journals
eISSN - 2233-6648
pISSN - 1598-5385
DOI - 10.4283/jkms.2009.19.4.121
Subject(s) - amorphous solid , materials science , x ray photoelectron spectroscopy , magnetoresistance , analytical chemistry (journal) , van der pauw method , annealing (glass) , electrical resistivity and conductivity , thin film , hall effect , diffractometer , crystallography , nuclear magnetic resonance , chemistry , scanning electron microscope , nanotechnology , physics , magnetic field , quantum mechanics , chromatography , composite material