Open AccessThe Exchange Bias of NiO/NiFe Thin Eilm by the Measurement of Anisotropic Mngnetoresistance
Author(s) -
Jong-Kee Kim,
Sunwook Kim,
Ky-Am Lee,
Sang-Suk Lee,
Do-Guwn Hwang
Publication year - 2002
Publication title -
journal of the korean magnetics society
Language(s) - English
Resource type - Journals
eISSN - 2233-6648
pISSN - 1598-5385
DOI - 10.4283/jkms.2002.12.4.143
Subject(s) - non blocking i/o , exchange bias , materials science , coupling (piping) , condensed matter physics , field (mathematics) , anisotropy , thin film , bilayer , analytical chemistry (journal) , metallurgy , magnetic anisotropy , physics , nanotechnology , magnetic field , chemistry , optics , magnetization , catalysis , mathematics , chromatography , quantum mechanics , membrane , pure mathematics , biochemistry
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