Predicted Device-Degradation Failure-Rate | Zendy

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Predicted Device-Degradation Failure-Rate

Author(s) -

E. Suhir,

Alain Bensoussan,

J. Nicolics

Publication year - 2015

Publication title -

sae technical papers on cd-rom/sae technical paper series

Language(s) - Uncategorized

Resource type - Conference proceedings

SCImago Journal Rank - 0.295

H-Index - 107

eISSN - 1083-4958

pISSN - 0148-7191

DOI - 10.4271/2015-01-2555

Subject(s) - degradation (telecommunications) , failure rate , reliability engineering , computer science , environmental science , materials science , engineering , telecommunications

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