Open AccessStudy of Annealing the Damaged HPGe Detector
Author(s) -
Jianyong Zhang,
X. H. Mo,
X. Cai
Publication year - 2021
Publication title -
world journal of nuclear science and technology
Language(s) - English
Resource type - Journals
eISSN - 2161-6809
pISSN - 2161-6795
DOI - 10.4236/wjnst.2021.112007
Subject(s) - germanium , semiconductor detector , detector , annealing (glass) , materials science , nuclear physics , nuclear engineering , radiochemistry , environmental science , physics , optics , optoelectronics , silicon , chemistry , engineering , composite material