Open AccessUsing Narrow Line-Width Laser to Measure the Thickness and Refractive Index of the Film
Author(s) -
JunJie Fang
Publication year - 2020
Publication title -
natural science
Language(s) - English
Resource type - Journals
eISSN - 2150-4105
pISSN - 2150-4091
DOI - 10.4236/ns.2020.1211064
Subject(s) - refractive index , optics , materials science , laser , polarization (electrochemistry) , x ray optics , phase (matter) , reflection (computer programming) , physics , chemistry , quantum mechanics , x ray , computer science , programming language
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