Open AccessPhysical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique
Author(s) -
I. K. Battisha,
Amany El Nahrawy
Publication year - 2012
Publication title -
new journal of glass and ceramics
Language(s) - English
Resource type - Journals
eISSN - 2161-7562
pISSN - 2161-7554
DOI - 10.4236/njgc.2012.21004
Subject(s) - fourier transform infrared spectroscopy , scanning electron microscope , materials science , sol gel , phosphate , thin film , composite number , chemical engineering , nano , ion , nuclear chemistry , composite material , nanotechnology , chemistry , organic chemistry , engineering
A series of silica-phosphate nano-composites prepared as a host thin films Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique and doped with different concentrations of Er3+ ions have been synthesized using tetraesoxysilane TEOS, triethylphosphate TEP and erbium nitrate as precursor sources of silica, phosphorus and erbium oxides. The structural properties of pure silica-phosphate thin films and doped with different concentrations of Er3+ ions were studied, using x-ray diffraction (XRD) and Fourier Transform Infrared (FTIR). The morphology of silica-phosphate was characterized by Scanning electron microscope (SEM)