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Photoluminescence Spectroscopy as a Tool for Quality Control of GaN Thin Film to Be Used in Solar Cell Devices
Author(s) -
Gregório Mateus Santana,
Adolfo Mejía-Montero,
Betsabeé Marel Monroy-Peláez,
M. LópezLópez,
Y.L. Casallas-Moreno,
M. RamírezLópez,
G. ContrerasPuente,
O. de Melo
Publication year - 2014
Publication title -
materials sciences and applications
Language(s) - English
Resource type - Journals
eISSN - 2153-1188
pISSN - 2153-117X
DOI - 10.4236/msa.2014.55031
Subject(s) - materials science , photoluminescence , optoelectronics , amorphous solid , molecular beam epitaxy , band gap , thin film , substrate (aquarium) , spectroscopy , impurity , luminescence , solar cell , epitaxy , analytical chemistry (journal) , nanotechnology , crystallography , layer (electronics) , chemistry , physics , quantum mechanics , oceanography , organic chemistry , chromatography , geology

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