Effects of Electropulsing Induced Microstructural Changes on THz-Reflection and Electrical Conductivity of Al-Doped ZnO Thin-Films | Zendy

Yaohua Zhu | Zendy; Weien Lai | Zendy

Open Access

Effects of Electropulsing Induced Microstructural Changes on THz-Reflection and Electrical Conductivity of Al-Doped ZnO Thin-Films

Author(s) -

Yaohua Zhu,

Weien Lai

Publication year - 2016

Publication title -

journal of surface engineered materials and advanced technology

Language(s) - English

Resource type - Journals

eISSN - 2161-489X

pISSN - 2161-4881

DOI - 10.4236/jsemat.2016.63010

Subject(s) - materials science , thin film , conductivity , reflection (computer programming) , electrical resistivity and conductivity , doping , crystal (programming language) , texture (cosmology) , phase (matter) , terahertz radiation , electromigration , surface roughness , spectroscopy , composite material , optoelectronics , nanotechnology , chemistry , physics , engineering , computer science , electrical engineering , programming language , organic chemistry , quantum mechanics , artificial intelligence , image (mathematics)

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