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Influence of the Annealing Temperature on the Thickness and Roughness of La<SUB>2</SUB>Ti<SUB>2</SUB>O<SUB>7</SUB> Thin Films
Author(s) -
Mohamed Ahmed Baba,
Ala Gasim,
A. M. Awadelgied,
Nafie A. Almuslet,
Ahmed Mohamed Salih
Publication year - 2020
Publication title -
advances in materials physics and chemistry
Language(s) - English
Resource type - Journals
eISSN - 2162-5328
pISSN - 2162-531X
DOI - 10.4236/ampc.2020.108014
Subject(s) - materials science , annealing (glass) , thin film , scanning electron microscope , surface finish , surface roughness , analytical chemistry (journal) , pulsed laser deposition , root mean square , composite material , nanotechnology , chemistry , electrical engineering , engineering , chromatography

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