Open AccessModelling Complete Power Outage Data Using Reliability
Author(s) -
N. P. Akpan,
Ngang Bassey
Publication year - 2021
Publication title -
american journal of operations research
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2160-8849
pISSN - 2160-8830
DOI - 10.4236/ajor.2021.112005
Subject(s) - weibull distribution , statistics , log normal distribution , reliability (semiconductor) , mathematics , exponential function , exponential distribution , maximum likelihood , power (physics) , independent and identically distributed random variables , computation , reliability engineering , algorithm , random variable , engineering , mathematical analysis , physics , quantum mechanics