Open AccessAnalysis of Failure in Miniature X‐ray Tubes with Gated Carbon Nanotube Field Emitters
Author(s) -
Kang JunTae,
Kim JaeWoo,
Jeong JinWoo,
Choi Sungyoul,
Choi Jeongyong,
Ahn Seungjoon,
Song YoonHo
Publication year - 2013
Publication title -
etri journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.295
H-Index - 46
eISSN - 2233-7326
pISSN - 1225-6463
DOI - 10.4218/etrij.13.0213.0346
Subject(s) - materials science , anode , leakage (economics) , carbon nanotube , optoelectronics , voltage , fabrication , field electron emission , gate oxide , tube (container) , electrode , electrical engineering , nanotechnology , engineering , transistor , composite material , chemistry , physics , medicine , alternative medicine , pathology , quantum mechanics , economics , macroeconomics , electron
We correlate the failure in miniature X‐ray tubes with the field emission gate leakage current of gated carbon nanotube emitters. The miniature X‐ray tube, even with a small gate leakage current, exhibits an induced voltage on the gate electrode by the anode bias voltage, resulting in a very unstable operation and finally a failure. The induced gate voltage is apparently caused by charging at the insulating spacer of the miniature X‐ray tube through the gate leakage current of the field emission. The gate leakage current could be a criterion for the successful fabrication of miniature X‐ray tubes.