Open AccessOn the New Design of a 4‐Port TEM Waveguide with a Higher Cutoff Frequency and Wider Test Volume
Author(s) -
Jeon Sangbong,
Yun Jaehoon,
Park Seungkeun
Publication year - 2012
Publication title -
etri journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.295
H-Index - 46
eISSN - 2233-7326
pISSN - 1225-6463
DOI - 10.4218/etrij.12.0212.0022
Subject(s) - miniaturization , cutoff frequency , waveguide , electromagnetic compatibility , cutoff , port (circuit theory) , electrical impedance , impedance matching , transverse plane , electronic engineering , optics , engineering , electrical engineering , physics , structural engineering , quantum mechanics
A new miniaturized 4‐port waveguide generating a transverse electromagnetic wave is proposed. The waveguide presents enhanced performance of higher field uniformity in extended test volume up to an increased test frequency limit compared to that of the conventional 2‐port waveguide. The advantageous features of the proposed waveguide have been obtained through a new design scheme based on effective miniaturization maintaining good impedance matching. Consequently, we can provide a more accurate electromagnetic compatibility test method, covering larger devices operating in higher frequencies, which is a marked improvement upon the conventional approaches.