Open AccessDifferential Fault Analysis for Round‐Reduced AES by Fault Injection
Author(s) -
Park JeaHoon,
Moon SangJae,
Choi DooHo,
Kang YouSung,
Ha JaeCheol
Publication year - 2011
Publication title -
etri journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.295
H-Index - 46
eISSN - 2233-7326
pISSN - 1225-6463
DOI - 10.4218/etrij.11.0110.0478
Subject(s) - advanced encryption standard , fault injection , plaintext , ciphertext , key (lock) , byte , fault (geology) , computer science , embedded system , microcontroller , encryption , differential (mechanical device) , block cipher , software , computer hardware , engineering , operating system , aerospace engineering , seismology , geology
This paper presents a practical differential fault analysis method for the faulty Advanced Encryption Standard (AES) with a reduced round by means of a semi‐invasive fault injection. To verify our proposal, we implement the AES software on the ATmega128 microcontroller as recommended in the standard document FIPS 197. We reduce the number of rounds using a laser beam injection in the experiment. To deduce the initial round key, we perform an exhaustive search for possible key bytes associated with faulty ciphertexts. Based on the simulation result, our proposal extracts the AES 128‐bit secret key in less than 10 hours with 10 pairs of plaintext and faulty ciphertext.