Open AccessA Novel BIRA Method with High Repair Efficiency and Small Hardware Overhead
Author(s) -
Yang MyungHoon,
Cho Hyungjun,
Jeong Woosik,
Kang Sungho
Publication year - 2009
Publication title -
etri journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.295
H-Index - 46
eISSN - 2233-7326
pISSN - 1225-6463
DOI - 10.4218/etrij.09.0209.0024
Subject(s) - overhead (engineering) , computer science , embedded system , computer hardware , operating system
Built‐in redundancy analysis (BIRA) is widely used to enhance the yield of embedded memories. In this letter, a new BIRA method for both high repair efficiency and small hardware overhead is presented. The proposed method performs redundancy analysis operations using the spare mapping registers with a covered fault list. Experimental results demonstrate the superiority of the proposed method compared to previous works.