Open AccessSimple Near‐Field Optical Recording Using Bent Cantilever Probes
Author(s) -
Kim Jeongyong,
Song Ki Bong,
Park KangHo,
Lee Hyo Won,
Kim Eunkyoung
Publication year - 2002
Publication title -
etri journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.295
H-Index - 46
eISSN - 2233-7326
pISSN - 1225-6463
DOI - 10.4218/etrij.02.0102.0304
Subject(s) - cantilever , materials science , bent molecular geometry , optics , optical recording , optoelectronics , reading (process) , image resolution , physics , political science , law , composite material
This paper describes our high‐density near‐field optical recording using bent cantilever fiber probes installed in an atomic force microscope. We conducted a near‐field reading of nano‐scale hole patterns with a 100 nm spatial resolution and a 25 µm/s scan speed; this implies a capability of a data reading density of 60 Gb/in 2 with a 0.25 kbps data transfer rate. In addition, we investigated re‐writable near‐field recording on photochromic diarylethene films. We successfully recorded erasable memory bits having a minimum width of 600 nm in a writing time as short as 30 ms. We found that using a cantilever probe simplifies the setup and operation of the near‐field optical recording system and may offer multifunctional recording capabilities.