
Strong dynamical screening of the (e, 2e) processes for electron impact ionization of helium in the perpendicular plane symmetric geometry
Author(s) -
ZhanBin Chen
Publication year - 2012
Publication title -
journal of atomic and molecular sciences
Language(s) - English
Resource type - Journals
eISSN - 2079-7346
pISSN - 2075-1303
DOI - 10.4208/jams.070111.080311a
Subject(s) - perpendicular , plane (geometry) , electron , helium , ionization , atomic physics , physics , electron ionization , geometry , ion , nuclear physics , quantum mechanics , mathematics