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Total Reflection X-Ray Fluorescence Spectroscopy to Evaluate Heavy Metals Accumulation in Legumes
Author(s) -
Bilo, Fabjola,
Borgese, Laura,
Zacco, Annalisa,
Lazo, Pranvera,
Zoani, Claudia,
Zappa, Giovanna,
Bontempi, Elza,
Eleonora Depero, Laura
Publication year - 2016
Publication title -
journal of analytical and bioanalytical techniques
Language(s) - English
Resource type - Journals
ISSN - 2155-9872
DOI - 10.4172/2155-9872.1000292
Subject(s) - x ray fluorescence , sample preparation , microwave digestion , quantitative analysis (chemistry) , total internal reflection , heavy metals , metal , contamination , chemistry , fluorescence , analytical chemistry (journal) , materials science , environmental chemistry , chromatography , detection limit , metallurgy , optics , physics , ecology , optoelectronics , biology
This work is to demonstrate the usefulness of total reflection X-ray fluorescence (TXRF) for fast and reliable\udquantitative analysis of heavy metals in plants used for accumulation studies. A model study of beans germination in\udlead contaminated environment under controlled laboratory conditions was realized. Metal accumulation in different\udparts of the plant was evaluated. Two different sample preparation procedures for TXRF analysis were considered:\udmicrowave acid digestion and direct analysis of suspended powdered sample. Quantitative determination of macro,\udmicro, and trace elements was performed. Root showed the highest accumulation of lead, followed by stem, leaves\udand crops. Results showed that direct analysis of suspended powdered samples may be used as a fast and simple\udmethod for screening

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