Open AccessEvaluation of debris and smear layer removal with XP-endo finisher: A scanning electron microscopic study
Author(s) -
Anita Jayakumaar,
Arathi Ganesh,
Rajeswari Kalaiselvam,
Mathan Rajan,
Deivanayagam Kandaswamy
Publication year - 2019
Publication title -
indian journal of dental research/indian journal of dental research
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.277
H-Index - 43
eISSN - 1998-3603
pISSN - 0970-9290
DOI - 10.4103/ijdr.ijdr_655_17
Subject(s) - smear layer , cementoenamel junction , sodium hypochlorite , dentistry , root canal , debris , magnification , premolar , scanning electron microscope , medicine , materials science , orthodontics , molar , chemistry , composite material , geology , physics , oceanography , organic chemistry , optics
The presence of smear layer and debris can prevent the irrigant and sealer from penetrating the dentinal tubules thereby compromising the seal of the root canal filling.