Evaluation of debris and smear layer removal with XP-endo finisher: A scanning electron microscopic study | Zendy

Arathi Ganesh | Zendy; Anita Jayakumaar | Zendy; Rajeswari Kalaiselvam | Zendy; Mathan Rajan | Zendy; Deivanayagam Kandaswamy | Zendy

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Evaluation of debris and smear layer removal with XP-endo finisher: A scanning electron microscopic study

Author(s) -

Arathi Ganesh,

Anita Jayakumaar,

Rajeswari Kalaiselvam,

Mathan Rajan,

Deivanayagam Kandaswamy

Publication year - 2019

Publication title -

indian journal of dental research

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.277

H-Index - 43

eISSN - 1998-3603

pISSN - 0970-9290

DOI - 10.4103/ijdr.ijdr_655_17

Subject(s) - smear layer , cementoenamel junction , sodium hypochlorite , dentistry , root canal , debris , magnification , premolar , scanning electron microscope , medicine , materials science , orthodontics , molar , chemistry , composite material , geology , physics , oceanography , organic chemistry , optics

The presence of smear layer and debris can prevent the irrigant and sealer from penetrating the dentinal tubules thereby compromising the seal of the root canal filling.

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