Open AccessA study of gamma radiation induced changes in electrical properties of Aℓ/TeO 2 /n-Si/Aℓ mos capacitor for dosimetric applications
Author(s) -
G. Chourasiya,
T.K. Maity,
SL Sharma,
Jit Sarkar,
JC Vyas
Publication year - 2011
Publication title -
radiation protection and environment
Language(s) - English
Resource type - Journals
eISSN - 2250-0995
pISSN - 0972-0464
DOI - 10.4103/0972-0464.106181
Subject(s) - dosimeter , capacitor , radiation , materials science , ionizing radiation , dosimetry , dielectric , optoelectronics , gamma ray , permittivity , radiochemistry , irradiation , optics , chemistry , physics , nuclear medicine , voltage , nuclear physics , medicine , quantum mechanics
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