Open AccessA study of gamma radiation induced changes in electrical properties of Aℓ/TeO2/n-Si/Aℓ mos capacitor for dosimetric applications
Author(s) -
G. Chourasiya,
T.K. Maity,
Saurabh Sharma,
Jit Sarkar,
J.C. Vyas
Publication year - 2011
Publication title -
radiation protection and environment/radiation protection and environment
Language(s) - English
Resource type - Journals
eISSN - 2250-0995
pISSN - 0972-0464
DOI - 10.4103/0972-0464.106181
Subject(s) - capacitor , dosimeter , radiation , materials science , ionizing radiation , dosimetry , dielectric , gamma ray , optoelectronics , permittivity , irradiation , radiochemistry , optics , chemistry , physics , nuclear medicine , voltage , nuclear physics , medicine , quantum mechanics