Open AccessInvetigation of the thickness and chemistry of Mo, W and Cr thin films on mild steel using XPS/AES surface techniques with depth profiling capability
Author(s) -
J R Brown,
L E Galbraith
Publication year - 1983
Language(s) - English
Resource type - Reports
DOI - 10.4095/302455
Subject(s) - x ray photoelectron spectroscopy , profiling (computer programming) , materials science , analytical chemistry (journal) , metallurgy , chemistry , chemical engineering , computer science , environmental chemistry , engineering , operating system
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