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Defect Detection in Woven Fabrics by Analysis of Co-occurrence Texture Features as a Function of Gray-level Quantization and Window Size
Author(s) -
P. S. H. Pallemulla,
Sulochana Sooriyaarachchi,
C. R. De Silva,
Chandana Gamage
Publication year - 2021
Publication title -
engineer
Language(s) - English
Resource type - Journals
eISSN - 2550-3219
pISSN - 1800-1122
DOI - 10.4038/engineer.v54i4.7470
Subject(s) - sri lanka , schematic , computer science , gray (unit) , institution , engineering management , artificial intelligence , operations research , engineering , geography , sociology , electrical engineering , environmental planning , social science , medicine , radiology , tanzania

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