Open AccessProfiling of proton beams by fluence scanners
Author(s) -
L. Deveikis,
J. Vaitkus,
T. Čeponis,
Mindaugas Gaspariūnas,
Vitalij Kovalevskij,
Vytautas Rumbauskas,
E. Gaubas
Publication year - 2021
Publication title -
lithuanian journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.269
H-Index - 16
eISSN - 2424-3647
pISSN - 1648-8504
DOI - 10.3952/physics.v61i2.4436
Subject(s) - fluence , proton , beam (structure) , scintillation , radiation , neutron , nuclear physics , materials science , charged particle , irradiation , optics , physics , ion , quantum mechanics , detector
Profiling of particle beams is one of the most important diagnostic procedures for operating any kind of accelerator. In this work, the proton beam profilers, based on fluence measurements performed by recording the changes of carrier lifetime in Si material and scintillation intensity of thin GaN layers, caused by radiation induced defects and emission centres, are presented. The beams of penetrative (26 GeV/c) and stopped (1.6 MeV) protons have been examined. It is shown that the penetrative particle regime should be employed to appropriately record 2D fluence distribution profiles. It is also illustrated that the presented profiling techniques can be applied for scanning of other charged (namely, pions) and neutral (neutrons) particle beams.