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Assessment of effective-medium theories of ion-beam sputtered Nb2O5–SiO2 and ZrO2–SiO2 mixtures
Author(s) -
Tomas Tolenis,
Mindaugas Gaspariūnas,
Martynas Lelis,
A. Plukis,
Rytis Buzelis,
Andrius Melninkaitis
Publication year - 2014
Publication title -
lithuanian journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.269
H-Index - 16
eISSN - 2424-3647
pISSN - 1648-8504
DOI - 10.3952/lithjphys.54205
Subject(s) - x ray photoelectron spectroscopy , sputtering , materials science , characterization (materials science) , spectroscopy , ion beam , deposition (geology) , rutherford backscattering spectrometry , analytical chemistry (journal) , beam (structure) , ion , layer (electronics) , atomic physics , thin film , chemistry , optics , nuclear magnetic resonance , nanotechnology , physics , paleontology , organic chemistry , quantum mechanics , chromatography , sediment , biology

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