Open AccessQuantum Material Metrology based on Nanoscale Quantum Devices
Author(s) -
Suyong Jung,
Junho Suh,
YongSung Kim
Publication year - 2019
Publication title -
physics and high technology
Language(s) - Uncategorized
Resource type - Journals
ISSN - 1225-2336
DOI - 10.3938/phit.28.044
Subject(s) - quantum metrology , nanoscopic scale , quantum , metrology , quantum sensor , quantum technology , nanotechnology , materials science , physics , quantum mechanics , open quantum system
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