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Modeling the effects of density dependent emigration, weak Allee effects, and matrix hostility on patch-level population persistence
Author(s) -
James T. Cronin,
Nalin Fonseka,
Jérome Goddard,
Jackson M. Leonard,
R. Shivaji
Publication year - 2020
Publication title -
mathematical biosciences and engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.451
H-Index - 45
eISSN - 1551-0018
pISSN - 1547-1063
DOI - 10.3934/mbe.2020090
Subject(s) - allee effect , population , density dependence , persistence (discontinuity) , emigration , statistical physics , mathematics , population density , statistics , demography , physics , geography , geology , geotechnical engineering , archaeology , sociology

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