z-logo
open-access-imgOpen Access
Fabrication of aluminum microwires through artificial weak spots in a thick film using stress-induced migration
Author(s) -
Hsin-Tzu Lee,
Yasuhiro Kimura,
Masumi Saka
Publication year - 2018
Publication title -
aims materials science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.367
H-Index - 16
eISSN - 2372-0484
pISSN - 2372-0468
DOI - 10.3934/matersci.2018.4.591
Subject(s) - materials science , passivation , hillock , fabrication , aluminium , stress (linguistics) , substrate (aquarium) , composite material , nanotechnology , nanomaterials , layer (electronics) , optoelectronics , medicine , linguistics , philosophy , alternative medicine , pathology , oceanography , geology

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom