Reliability and Failure Rate of the Electronic System by Using Mixture Lindley Distribution
Author(s) -
Medhat Ahmed El Damsesy,
Mohammed Mohammed El Genidy
Publication year - 2015
Publication title -
journal of applied sciences
Language(s) - English
Resource type - Journals
eISSN - 1812-5662
pISSN - 1812-5654
DOI - 10.3923/jas.2015.524.530
Subject(s) - reliability engineering , failure rate , reliability (semiconductor) , distribution (mathematics) , statistics , computer science , mathematics , thermodynamics , engineering , physics , mathematical analysis , power (physics)
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom