Open AccessEstimation the Failure Rate and Reliability of the Triple Modular Redundancy System Using Weibull Distribution
Author(s) -
Mohammed Mohammed El Genidy,
Esraa Ahmed Hebeshy
Publication year - 2017
Publication title -
asian journal of scientific research
Language(s) - English
Resource type - Journals
eISSN - 2077-2076
pISSN - 1992-1454
DOI - 10.3923/ajsr.2017.128.138
Subject(s) - weibull distribution , reliability engineering , triple modular redundancy , redundancy (engineering) , modular design , reliability (semiconductor) , failure rate , computer science , statistics , mathematics , engineering , physics , operating system , power (physics) , quantum mechanics
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