Open AccessXRD, XPS, and optical characterizations of Al-doped ZnO film grown on GaAs substrate
Author(s) -
Ebru Şenadım Tüzemen,
H. Şahin,
Kamuran Kara,
S. Elagöz,
Ramazan Esen
Publication year - 2014
Publication title -
turkish journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.169
H-Index - 26
eISSN - 1303-6122
pISSN - 1300-0101
DOI - 10.3906/fiz-1301-17
Subject(s) - x ray photoelectron spectroscopy , materials science , thin film , annealing (glass) , amorphous solid , analytical chemistry (journal) , doping , diffraction , vacuum arc , substrate (aquarium) , band gap , optoelectronics , optics , chemical engineering , nanotechnology , crystallography , metallurgy , chemistry , physics , oceanography , cathode , chromatography , geology , engineering