Open AccessA 3D model for thickness and diffusion capacitance of emitter-base junction determination in a bifacial polycrystalline solar cell under real operating condition
Author(s) -
Senghane Mbodji,
B. Mbow,
Fabé Idrissa Barro,
G. Sissoko
Publication year - 2011
Publication title -
turkish journal of physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.169
H-Index - 26
eISSN - 1303-6122
pISSN - 1300-0101
DOI - 10.3906/fiz-0911-25
Subject(s) - materials science , capacitance , solar cell , diffusion capacitance , diffusion , depletion region , polycrystalline silicon , charge carrier , common emitter , crystallite , wavelength , recombination , grain boundary , space charge , plane (geometry) , condensed matter physics , optoelectronics , physics , geometry , layer (electronics) , composite material , semiconductor , electron , thermodynamics , chemistry , microstructure , biochemistry , quantum mechanics , metallurgy , electrode , gene , thin film transistor , mathematics