A 3D model for thickness and diffusion capacitance of emitter-base junction determination in a bifacial polycrystalline solar cell under real operating condition | Zendy

Senghane Mbodji | Zendy; B. Mbow | Zendy; Fabé Idrissa Barro | Zendy; Grégoire Sissoko | Zendy

Open Access

A 3D model for thickness and diffusion capacitance of emitter-base junction determination in a bifacial polycrystalline solar cell under real operating condition

Author(s) -

Senghane Mbodji,

B. Mbow,

Fabé Idrissa Barro,

Grégoire Sissoko

Publication year - 2011

Publication title -

turkish journal of physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.169

H-Index - 26

eISSN - 1303-6122

pISSN - 1300-0101

DOI - 10.3906/fiz-0911-25

Subject(s) - materials science , capacitance , solar cell , diffusion capacitance , diffusion , depletion region , polycrystalline silicon , charge carrier , common emitter , crystallite , wavelength , recombination , grain boundary , space charge , plane (geometry) , condensed matter physics , optoelectronics , physics , geometry , layer (electronics) , composite material , semiconductor , electron , thermodynamics , chemistry , microstructure , biochemistry , quantum mechanics , metallurgy , electrode , gene , thin film transistor , mathematics

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