Open AccessStudy on the Design of Statistical Schemes for Reliability Demonstration Test of Electromechanical Equipment
Author(s) -
Yashun Wang,
Shufeng Zhang,
Xun Chen
Publication year - 2021
Publication title -
jixie gongcheng xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.342
H-Index - 50
ISSN - 0577-6686
DOI - 10.3901/jme.2021.12.247
Subject(s) - reliability engineering , reliability (semiconductor) , test (biology) , test equipment , computer science , engineering , geology , physics , paleontology , power (physics) , quantum mechanics