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Failure Mode and Effects Analysis and Time Varying Reliability of Solar Array Drive Assembly
Author(s) -
LI Yan-feng,
Huang Hongzhong,
Huang Yixian
Publication year - 2020
Publication title -
journal of mechanical engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.342
H-Index - 50
ISSN - 0577-6686
DOI - 10.3901/jme.2020.05.108
Subject(s) - reliability (semiconductor) , mode (computer interface) , failure mode and effects analysis , reliability engineering , computer science , environmental science , engineering , physics , power (physics) , quantum mechanics , operating system

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