Open AccessFuzzy Reliability Assessment Method Based on T-S Fault Tree and Bayesian Network
Author(s) -
Chengyu Yao
Publication year - 2014
Publication title -
jixie gongcheng xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.342
H-Index - 50
ISSN - 0577-6686
DOI - 10.3901/jme.2014.02.193
Subject(s) - bayesian network , fault tree analysis , reliability (semiconductor) , fuzzy logic , computer science , reliability engineering , data mining , bayesian probability , artificial intelligence , machine learning , engineering , power (physics) , physics , quantum mechanics