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Characterization of α-Cu<sub>2</sub>Se Fine Structure by Spherical-Aberration-Corrected Scanning Transmission Electron Microscope
Author(s) -
Lu Chen,
Jun Liu,
Yong Wang,
Ze Zhang
Publication year - 2019
Publication title -
wuli huaxue xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.396
H-Index - 37
ISSN - 1000-6818
DOI - 10.3866/pku.whxb201805111
Subject(s) - characterization (materials science) , transmission electron microscopy , spherical aberration , scanning transmission electron microscopy , conventional transmission electron microscope , electron , scanning electron microscope , optics , materials science , electron microscope , transmission (telecommunications) , contrast transfer function , microscope , physics , computer science , telecommunications , quantum mechanics , lens (geology)

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