Open AccessCharacterization of Mesoporous Silica Film Sensitized SERS Substrates Based on Evanescent-Wave Excitation
Author(s) -
Qian Zhao,
传感技术国家重点实验室 中国科学院电子学研究所,
Dan Lu,
Chen Chen,
Qi Zang
Publication year - 2014
Publication title -
wuli huaxue xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.396
H-Index - 37
ISSN - 1000-6818
DOI - 10.3866/pku.whxb201410131
Subject(s) - mesoporous silica , characterization (materials science) , materials science , evanescent wave , excitation , mesoporous material , nanotechnology , chemical engineering , optoelectronics , chemistry , organic chemistry , engineering , catalysis , electrical engineering