Open AccessThe Semiconducting Properties of Oxide Films Formed on Chromium Studied by Capacitance Measurement
Author(s) -
Kong De-Sheng,
曲阜 曲阜师范大学化学系,
Li Liang
Publication year - 2004
Publication title -
wuli huaxue xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.396
H-Index - 37
ISSN - 1000-6818
DOI - 10.3866/pku.whxb20040616
Subject(s) - materials science , capacitance , chromium , chromium oxide , oxide , optoelectronics , chemical engineering , nanotechnology , metallurgy , chemistry , electrode , engineering