Open AccessComparision of Voltage Stress Across the MOSFET Switch of a Flyback Converter with Various Snubbers
Author(s) -
- Soumya,
A.N. Nagashree,
Geetha Rv
Publication year - 2020
Publication title -
international journal of innovative science and research technology
Language(s) - English
Resource type - Journals
ISSN - 2456-2165
DOI - 10.38124/ijisrt20jun1114
Subject(s) - snubber , flyback transformer , flyback converter , electrical engineering , forward converter , leakage inductance , capacitor , transformer , voltage spike , flyback diode , buck–boost converter , electronic engineering , boost converter , voltage , materials science , computer science , engineering
A Flyback converter is a simple switch-mode power supply that can be used to generate a DC output from either an AC or DC input. The converter switch is the most critical part of any converter. The voltage stress across the switch is a major issue as the high voltage spikes occur due to interaction between its output capacitance and the leakage inductance of the transformer. These spikes can be reduced with various snubbers like conventional tertiary winding, Resistor Capacitor and Diode(RCD) snubber, energy regenerative snubber and an active clamp snubber. This paper aims to analyze and compare the voltage stress across the MOSFET switch of Flyback converter with various snubber circuits.