Open AccessDetermining the Thickness of a Trilayer Thin-Film Structure by Fourier-Transform Analysis
Author(s) -
Hyun-Ju Cho,
J.H. Won,
Young-Gyu Jeong,
Bong-Ju Woo,
Junho Yoon,
Chang-Kwon Hwangbo
Publication year - 2016
Publication title -
han-guk gwanghak hoeji/han'gug gwanghag hoeji
Language(s) - English
Resource type - Journals
eISSN - 2287-321X
pISSN - 1225-6285
DOI - 10.3807/kjop.2016.27.4.143
Subject(s) - materials science , fourier transform , optics , refractive index , layer (electronics) , fourier transform infrared spectroscopy , fast fourier transform , thin film , composite material , physics , optoelectronics , mathematics , algorithm , mathematical analysis , nanotechnology