Measurements of Inner Defects of the Plate using Dual-beam Shearography
Author(s) -
Hyo-Shick Ham,
Sung-Eul Choi
Publication year - 2005
Publication title -
korean journal of optics and photonics
Language(s) - English
Resource type - Journals
eISSN - 2287-321X
pISSN - 1225-6285
DOI - 10.3807/kjop.2005.16.3.239
Subject(s) - shearography , optics , shearing (physics) , materials science , speckle pattern , shearing interferometer , beam (structure) , electronic speckle pattern interferometry , interferometry , deformation (meteorology) , physics , astronomical interferometer , composite material
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