Open AccessReal time control of the growth of Ge-Sb-Te multi-layer film as an optical recording media using in-situ ellipsometry
Publication year - 2002
Publication title -
korean journal of optics and photonics
Language(s) - English
Resource type - Journals
eISSN - 2287-321X
pISSN - 1225-6285
DOI - 10.3807/kjop.2002.13.3.215
Subject(s) - ellipsometry , in situ , optics , materials science , layer (electronics) , optical disc , optoelectronics , thin film , chemistry , physics , nanotechnology , organic chemistry
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